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JUWEL - Volltextserver des Forschungszentrums Jülich >
Forschungszentrum Jülich >
Institut für Festkörperforschung - Streumethoden (IFF-4) (ehemals IFF-ISM) >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/2128/1175
|
| Title: | Temperature induced differences in the nanostructure of hot-wire deposited silicon-germanium alloys analyzed by anomalous small-angle x-ray scattering |
| Authors: | Goerigk, G. Williamson, D. L. |
| Issue Date: | 2006 |
| Publisher: | AMER INST PHYSICS |
| Citation: | Journal of Applied Physics, 99 (2006), 084309-1 - 084309-8 |
| Description: | This version is available at the following Publisher URL: http://jap.aip.org |
| URI: | http://dx.doi.org/10.1063/1.2187088 http://hdl.handle.net/2128/1175 |
| ISSN: | 0021-8979 |
| Appears in Collections: | Institut für Festkörperforschung - Streumethoden (IFF-4) (ehemals IFF-ISM) |
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